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Thermal imaging of semiconductor chip with heat distribution
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Why Thermal Metrology Must Evolve for Next-Generation Semiconductors

IEEE Spectrum AI23 Mar
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As AI accelerators reach extreme power densities exceeding 1,000 W/cm², thermal management has become the primary constraint on semiconductor performance—surpassing lithography limitations. Next-generation chip design requires evolved thermal metrology techniques to handle 3D integration and novel materials, making advanced heat measurement critical for AI infrastructure advancement.

Heat, not chips, is now semiconductor scaling's biggest challenge.

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